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Journal of Applied Physics

Volumn 64, Issue 5, 1988, Pages 2434-2438

An electron paramagnetic resonance study of electron injected oxides in metal-oxide-semiconductor capacitors

(4) Trombetta, L P a Gerardi, G J a Dimaria, D J b Tierney, E b

a U S ARMY RESEARCH LABORATORY (United States)

b IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36549098783 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.341678 Document Type: Article

Times cited : (56)

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