Radiation-induced paramagnetic defects in Mos structures

IEEE Transactions on Nuclear Science

Volumn 29, Issue 6, 1982, Pages 1459-1461

  Lenahan, P M ^a   Dressendorfer, P V ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC RESONANCE;

SEMICONDUCTOR DEVICES, MOS;

EID: 0020253294     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1982.4336386     Document Type: Article

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