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Volumn , Issue , 2006, Pages 203-235

INDIUM-NITRIDE GROWTH BY HIGH-PRESSURE CVD: REAL-TIME AND EX-SITU CHARACTERIZATION

Author keywords

[No Author keywords available]

Indexed keywords


EID: 85136013717     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1142/9781860949036_0006     Document Type: Chapter
Times cited : (9)

References (35)
  • 22
    • 0035944612 scopus 로고    scopus 로고
    • Real-time optical Characterization of thin film growth
    • N. Dietz, “Real-time optical Characterization of thin film growth, " Mat. Sci. and Eng. B 87 (1), pp.1-22 (2001).
    • (2001) Mat. Sci. and Eng. B , vol.87 , Issue.1 , pp. 1-22
    • Dietz, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.