Low-Energy Electron Microscopy for Nanoscale Characterization

Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes)

Volumn , Issue , 2011, Pages 127-181

  Hannon, James B ^a   Tromp, Rudolf M ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

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[No Author keywords available]

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EID: 85116566225     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Chapter

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