A simple energy filter for low energy electron microscopy/photoelectron emission microscopy instruments

Journal of Physics Condensed Matter

Volumn 21, Issue 31, 2009, Pages

  Tromp, R M ^a   Fujikawa, Y ^b   Hannon, J B ^a   Ellis, A W ^a   Berghaus, A ^c   Schaff, O ^c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b TOHOKU UNIVERSITY   (Japan)

^c SPECS SURFACE NANO ANALYSIS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AG NANOWIRES; ELECTRON ENERGIES; ELECTRON ENERGY SPECTRUM; EMISSION MICROSCOPY; ENERGY FILTER; ENERGY LOSS; ENERGY PASS BANDS; ENERGY RESOLUTIONS; FILTERED IMAGES; LOW ENERGY ELECTRON MICROSCOPY; LOW ENERGY ELECTRONS; PHOTOELECTRON EMISSION MICROSCOPY; SI(0 0 1); SPATIAL RESOLUTION; TRANSFER OPTICS; VERY HIGH ENERGIES;

ANGULAR DISTRIBUTION; BALLOONS; DISSOCIATION; ELECTRIC WIRE; ELECTRON ENERGY LEVELS; ELECTRONS; ENERGY DISSIPATION; HELIUM; LIGHT; LIGHT SOURCES; SILVER; SPECTROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 70249147634     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/31/314007     Document Type: Article

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