Space charge effects in photoemission electron microscopy using amplified femtosecond laser pulses

Journal of Physics Condensed Matter

Volumn 21, Issue 31, 2009, Pages

  Buckanie, N M ^a   Gohre J ^a   Zhou, P ^a   Von Der Linde, D ^a   Horn Von Hoegen, M ^a   Meyer Zu Heringdorf, F J ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON PATH; ENERGY RESOLUTIONS; FEMTO-SECOND LASER; FEMTOSECOND LASER PULSE; IMAGE BLUR; NONLINEAR PHOTOEMISSION; PHOTOEMISSION ELECTRON MICROSCOPY; PHOTOEMISSION SPECTRA; REPETITION RATE; SPACE CHARGE EFFECTS; SPECTRAL BROADENING;

ELECTRIC SPACE CHARGE; LASERS; PHOTOEMISSION; PULSED LASER APPLICATIONS; ULTRASHORT PULSES;

EMISSION SPECTROSCOPY;

EID: 70249130882     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/31/314003     Document Type: Article

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