Origins of nanoscale heterogeneity in ultrathin films

Physical Review Letters

Volumn 96, Issue 24, 2006, Pages

  Hannon, J B ^a   Sun, J ^b   Pohl, K ^b   Kellogg, G L ^c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b University of New Hampshire   (United States)

^c SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYS; COMPOSITION; COPPER; ELECTRON SCATTERING; FILM GROWTH; NANOSTRUCTURED MATERIALS; PALLADIUM;

ALLOY FILMS; ATOMIC SCALE; THIN FILM GROWTH; THREE DIMENSIONAL COMPOSITION;

ULTRATHIN FILMS;

EID: 33745378889     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.246103     Document Type: Article

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