Surface plasmon microscopy using an energy-filtered low energy electron microscope

Physical Review Letters

Volumn 100, Issue 12, 2008, Pages

  Fujikawa, Y ^a   Sakurai, T ^a   Tromp, R M ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL FILMS; LOW ENERGY ELECTRON DIFFRACTION; OPTICAL RESOLVING POWER; WAVE EFFECTS;

NANOPLASMONICS; SPATIAL RESOLUTION;

SURFACE PLASMON RESONANCE;

EID: 41549107074     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.100.126803     Document Type: Article

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