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Volumn , Issue , 2000, Pages 31-39

Improving on-line BIST-based diagnosis for roving STARs

Author keywords

[No Author keywords available]

Indexed keywords

STARS;

EID: 84960389355     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OLT.2000.856608     Document Type: Conference Paper
Times cited : (26)

References (26)
  • 1
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    • Using Roving STARs for On-Line Testing and Diagnosis of FPGAs in Fault-Tolerant Applications
    • M. Abramovici, C. Stroud, S. Wijesuriya, C. Hamilton, and V. Verma, "Using Roving STARs for On-Line Testing and Diagnosis of FPGAs in Fault-Tolerant Applications," Proc. Intn'l. Test Conf., pp. 973-982, 1999.
    • (1999) Proc. Intn'l. Test Conf. , pp. 973-982
    • Abramovici, M.1    Stroud, C.2    Wijesuriya, S.3    Hamilton, C.4    Verma, V.5
  • 2
    • 0031344115 scopus 로고    scopus 로고
    • On-Line Testable Logic Design for FPGA Implementation
    • A. Burress and P. Lala, "On-Line Testable Logic Design for FPGA Implementation", Proc. Intn'l. Test Conf., pp. 471-478, 1997.
    • (1997) Proc. Intn'l. Test Conf. , pp. 471-478
    • Burress, A.1    Lala, P.2
  • 6
    • 0029700925 scopus 로고    scopus 로고
    • An Approach to Testing Programmable/Configurable Field Programmable Gate Arrays
    • W. K. Huang and F. Lombardi, "An Approach to Testing Programmable/Configurable Field Programmable Gate Arrays," Proc. IEEE VLSI Test Symp., pp. 450-455, 1996.
    • (1996) Proc. IEEE VLSI Test Symp. , pp. 450-455
    • Huang, W.K.1    Lombardi, F.2
  • 8
    • 0031655580 scopus 로고    scopus 로고
    • Universal Fault Diagnosis for Lookup Table FPGAs
    • Jan
    • T. Inoue, S. Miyazaki, and H. Fujiwara, "Universal Fault Diagnosis for Lookup Table FPGAs," IEEE Design & Test of Computers, Vol. 15, No. 1, pp. 39-44, Jan. 1998.
    • (1998) IEEE Design & Test of Computers , vol.15 , Issue.1 , pp. 39-44
    • Inoue, T.1    Miyazaki, S.2    Fujiwara, H.3
  • 11
    • 85026993835 scopus 로고    scopus 로고
    • Lucent Technologies, Inc., http://www.micro.lucent.com/micro/fpga
  • 12
    • 0030652669 scopus 로고    scopus 로고
    • Test of RAM-Based FPGA: Methodology and Application to Interconnects
    • M. Renovell, J. Figueras, and Y. Zorian, "Test of RAM-Based FPGA: Methodology and Application to Interconnects," Proc. IEEE VLSI Test Symp., pp. 230-237, 1997.
    • (1997) Proc. IEEE VLSI Test Symp. , pp. 230-237
    • Renovell, M.1    Figueras, J.2    Zorian, Y.3
  • 17
    • 0032597679 scopus 로고    scopus 로고
    • On the Necessity of On-Line BIST in Safety Critical Applications
    • June
    • A. Steininger and Scherrer, "On the Necessity of On-Line BIST in Safety Critical Applications", Proc 29th Fault-Tolerant Computing Symp.", pp. 208-215, June 1999.
    • (1999) Proc 29th Fault-Tolerant Computing Symp. , pp. 208-215
    • Steininger, A.1    Scherrer2
  • 18
    • 0032293995 scopus 로고    scopus 로고
    • On-line Fault Detection for Bus-Based Field Programmable Gate Arrays
    • Dec
    • N. R. Shnidman, W. H. Mangione-Smith, and M. Potkonjak, "On-line Fault Detection for Bus-Based Field Programmable Gate Arrays," IEEE Trans. on VLSI Systems, Vol. 6, No. 4, pp. 656-666, Dec. 1998.
    • (1998) IEEE Trans. on VLSI Systems , vol.6 , Issue.4 , pp. 656-666
    • Shnidman, N.R.1    Mangione-Smith, W.H.2    Potkonjak, M.3
  • 20
    • 0029700620 scopus 로고    scopus 로고
    • Built-In Self-Test for Programmable Logic Blocks in FPGAs (Finally, A Free Lunch: BIST Without Overhead!)
    • C. Stroud, S. Konala, P. Chen, and M. Abramovici, "Built-In Self-Test for Programmable Logic Blocks in FPGAs (Finally, A Free Lunch: BIST Without Overhead!)", Proc. IEEE VLSI Test Symp., pp. 387-392, 1996.
    • (1996) Proc. IEEE VLSI Test Symp. , pp. 387-392
    • Stroud, C.1    Konala, S.2    Chen, P.3    Abramovici, M.4
  • 25
    • 85026992881 scopus 로고    scopus 로고
    • Xilinx, Inc., http://www.xilinx.com/products
  • 26
    • 0033309292 scopus 로고    scopus 로고
    • Finite State Machine Synthesis with Concurrent Error Detection
    • C. Zeng, N. Saxena, and E. J. McCluskey, "Finite State Machine Synthesis with Concurrent Error Detection", Proc. IEEE Intn'l. Test Conf., pp. 672-679, 1999.
    • (1999) Proc. IEEE Intn'l. Test Conf. , pp. 672-679
    • Zeng, C.1    Saxena, N.2    McCluskey, E.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.