Enhanced BIST-based diagnosis of FPGAs via boundary scan access

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 413-418

  Hamilton, Carter ^a   Gibson, Gretchen ^a   Wijesuriya, Sajitha ^a   Stroud, Charles ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; DATA STORAGE EQUIPMENT; INTEGRATED CIRCUIT TESTING; INTERFACES (COMPUTER); LOGIC DESIGN; STANDARDS;

BOUNDARY SCAN INTERFACE; TEST ACCESS PORT; TEST PATTERN GENERATORS;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 0032678903     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)