Test and diagnosis of faulty logic blocks in FPGAs

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1997, Pages 722-727

  Wang, Sying Jyan ^a   Tsai, Tsi Ming ^a  

^a NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; INTEGRATED CIRCUIT TESTING; LOGIC GATES;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

PARALLEL PROCESSING SYSTEMS;

EID: 0031340696     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)