BIST-based diagnostics of FPGA logic blocks

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 539-547

  Stroud, Charles ^a   Lee, Eric ^a   Abramovici, Miron ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; LOGIC DESIGN; LOGIC GATES;

BUILT IN SELF TEST (BIST); FIELD PROGRAMMABLE GATE ARRAYS (FPGA); PROGRAMMABLE LOGIC BLOCKS (PLB);

INTEGRATED CIRCUIT TESTING;

EID: 0031367953     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)