Built-in self-test of FPGA interconnect

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 404-411

  Stroud, Charles ^a   Wijesuriya, Sajitha ^a   Hamilton, Carter ^a   Abramovici, Miron ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERCONNECTS; PROGRAMMABLE ROUTING NETWORKS; PROGRAMMABLE SWITCHES;

BUILT-IN SELF TEST; ELECTRIC FAULT CURRENTS; ELECTRIC SWITCHES; FIELD PROGRAMMABLE GATE ARRAYS;

INTEGRATED CIRCUIT TESTING;

EID: 0032311588     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743180     Document Type: Conference Paper

References (15)