메뉴 건너뛰기




Volumn 6, Issue 4, 1998, Pages 656-666

On-line fault detection for bus-based field programmable gate arrays

Author keywords

Digital system fault tolerance; Field programmable gate arryas; Self testing

Indexed keywords

COMPUTER HARDWARE; FAULT TOLERANT COMPUTER SYSTEMS; ONLINE SYSTEMS; SCANNING; TESTING;

EID: 0032293995     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/92.736139     Document Type: Article
Times cited : (46)

References (29)
  • 3
    • 33747799245 scopus 로고    scopus 로고
    • Architecture issues and solutions for a high-capacity FPGA
    • Monterey, CA
    • S. Trimberger, K. Doung, and B. Conn, "Architecture issues and solutions for a high-capacity FPGA," in Proc. FPGA'97, Monterey, CA, 1997.
    • (1997) Proc. FPGA'97
    • Trimberger, S.1    Doung, K.2    Conn, B.3
  • 4
    • 0025505369 scopus 로고
    • Architectures of field-programmable gate arrays: The effect of logic block functionality on area efficiency
    • J. Rose, R. Francis, and P. Chow, "Architectures of field-programmable gate arrays: The effect of logic block functionality on area efficiency," IEEE J. Solid-State Circuits, pp. 1217-1225, 1990.
    • (1990) IEEE J. Solid-State Circuits , pp. 1217-1225
    • Rose, J.1    Francis, R.2    Chow, P.3
  • 5
    • 0007438643 scopus 로고    scopus 로고
    • San Jose, CA: Altera
    • Altera, Data Book. San Jose, CA: Altera, 1996.
    • (1996) Data Book
  • 6
    • 0029518340 scopus 로고
    • Advanced technologies for a command and data handling subsystem in a 'better, faster, cheaper' environment
    • Cambridge, MA
    • K. W. Bernhardt, "Advanced technologies for a command and data handling subsystem in a 'better, faster, cheaper' environment," in Proc. Digital Avionics Systems Conf., Cambridge, MA, 1995.
    • (1995) Proc. Digital Avionics Systems Conf.
    • Bernhardt, K.W.1
  • 7
    • 0020811741 scopus 로고
    • Functional testing of semiconductor random access memories
    • M. S. Abadir and H. Reghbati, "Functional testing of semiconductor random access memories," Comput. Surv., vol. 15, pp. 175-198, 1983.
    • (1983) Comput. Surv. , vol.15 , pp. 175-198
    • Abadir, M.S.1    Reghbati, H.2
  • 10
    • 0015986205 scopus 로고
    • On modifying logic networks to improve their diagnosability
    • Jan.
    • J. P. Hayes, "On modifying logic networks to improve their diagnosability," IEEE Trans. Comput., vol. C-23, pp. 56-62, Jan. 1974.
    • (1974) IEEE Trans. Comput. , vol.C-23 , pp. 56-62
    • Hayes, J.P.1
  • 11
    • 85160551624 scopus 로고
    • A study of the data communication problems in self-repairable multiprocessors
    • Washington, DC: Thompson
    • K. N. Levitt, M. W. Green, and J. Goldberg, "A study of the data communication problems in self-repairable multiprocessors," in Proc. Conf. AFIPS, vol. 32. Washington, DC: Thompson, 1968, pp. 515-527.
    • (1968) Proc. Conf. AFIPS , vol.32 , pp. 515-527
    • Levitt, K.N.1    Green, M.W.2    Goldberg, J.3
  • 13
    • 0029700620 scopus 로고    scopus 로고
    • Built-in self-test of logic blocks in FPGA's (finally, a free lunch: BIST without overhead!)
    • C. Stroud, S. Konala, P. Chen, and M. Ambramovici, "Built-in self-test of logic blocks in FPGA's (finally, a free lunch: BIST without overhead!)," in Proc. IEEE VLSI Test Symp., 1996.
    • (1996) Proc. IEEE VLSI Test Symp.
    • Stroud, C.1    Konala, S.2    Chen, P.3    Ambramovici, M.4
  • 14
    • 0029700925 scopus 로고    scopus 로고
    • An approach for testing programmable/configurable field programmable gate arrays
    • W. K. Huang and F. Lombardi, "An approach for testing programmable/configurable field programmable gate arrays," in Proc. IEEE VLSI Test Symp., 1996.
    • (1996) Proc. IEEE VLSI Test Symp.
    • Huang, W.K.1    Lombardi, F.2
  • 15
    • 0030411716 scopus 로고    scopus 로고
    • A test methodology for interconnect structures of LUT-based FPGA's
    • H. Michinishi et al., "A test methodology for interconnect structures of LUT-based FPGA's," in Proc. Asian Test Symp., 1996.
    • (1996) Proc. Asian Test Symp.
    • Michinishi, H.1
  • 16
    • 0029519091 scopus 로고
    • Universal test complexity of field-programmable gate arrays
    • T. Inoue et al., "Universal test complexity of field-programmable gate arrays," in Proc. Asian Test Symp., 1995.
    • (1995) Proc. Asian Test Symp.
    • Inoue, T.1
  • 21
    • 33747752788 scopus 로고
    • Reconfigurable logic for fault tolerance
    • Oxford, U.K.: Oxford University Press
    • R. Cuddapah and M. Corba, "Reconfigurable logic for fault tolerance," in Field Programmable Logic and Applications. Oxford, U.K.: Oxford University Press, 1995.
    • (1995) Field Programmable Logic and Applications
    • Cuddapah, R.1    Corba, M.2
  • 22
    • 0029713590 scopus 로고
    • Node-covering based defect and fault-tolerance methods for increased yield in FPGA's
    • F. Hanchek and S. Dutt, "Node-covering based defect and fault-tolerance methods for increased yield in FPGA's," in Proc. 9th Int. Conf. VLSI Design, 1995, pp. 225-229.
    • (1995) Proc. 9th Int. Conf. VLSI Design , pp. 225-229
    • Hanchek, F.1    Dutt, S.2
  • 23
    • 0028397566 scopus 로고
    • The yield enhancement of field-programmable gate arrays
    • N. J. Howard et al., "The yield enhancement of field-programmable gate arrays," IEEE Trans. VLSI Syst., vol. 2, pp. 115-123, 1994.
    • (1994) IEEE Trans. VLSI Syst. , vol.2 , pp. 115-123
    • Howard, N.J.1
  • 24
    • 0000484585 scopus 로고    scopus 로고
    • On routability for FPGA's under faulty conditions
    • K. Roy and S. Nag, "On routability for FPGA's under faulty conditions," IEEE Trans. Comput., vol. 44, pp. 1296-1305, 1996.
    • (1996) IEEE Trans. Comput. , vol.44 , pp. 1296-1305
    • Roy, K.1    Nag, S.2
  • 26
    • 0030169878 scopus 로고    scopus 로고
    • An experimental survey of heavy ion induced dielectric rupture in actel field programmable gate arrays (FPGA's)
    • G. Swift and R. Katz, "An experimental survey of heavy ion induced dielectric rupture in actel field programmable gate arrays (FPGA's)," IEEE Trans. Nucl. Sci., vol. 43, pp. 967-972, 1996.
    • (1996) IEEE Trans. Nucl. Sci. , vol.43 , pp. 967-972
    • Swift, G.1    Katz, R.2
  • 27
    • 0028714150 scopus 로고
    • Single event effect proton and heavy ion test results for candidate spacecraft electronics
    • K. A. LaBel et al., "Single event effect proton and heavy ion test results for candidate spacecraft electronics," in Proc. IEEE Radiation Effects Data Workshop, 1994.
    • (1994) Proc. IEEE Radiation Effects Data Workshop
    • LaBel, K.A.1
  • 28
    • 0023209043 scopus 로고
    • Using redundancy for concurrent testing and repairing of systolic arrays
    • Pittsburgh, PA
    • L. A. Shombert and D. P. Siewiorek, "Using redundancy for concurrent testing and repairing of systolic arrays," presented at FTCS-17, Pittsburgh, PA, 1987.
    • (1987) FTCS-17
    • Shombert, L.A.1    Siewiorek, D.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.