Evaluation of FPGA resources for built-in self-test of programmable logic blocks

ACM/SIGDA International Symposium on Field Programmable Gate Arrays - FPGA

Volumn , Issue , 1996, Pages 107-113

  Stroud, Charles ^a   Chen, Ping ^a   Konala, Srinivasa ^a   Abramovici, Miron ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CIRCUITS; ELECTRIC FAULT CURRENTS; LOGIC DEVICES; TABLE LOOKUP; TESTING;

BUILT IN SELF TEST; FIELD PROGRAMMABLE GATE ARRAYS; OFF LINE TEST; PSEUDOEXHAUSTIVE TESTING; REPROGRAMMABILITY; SYSTEM LEVEL TESTING;

LOGIC GATES;

EID: 0029713667     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/228370.228386     Document Type: Conference Paper

References (12)