Using ILA testing for BIST in FPGAs

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 68-75

  Stroud, Charles ^a   Lee, Eric ^a   Konala, Srinivasa ^a   Abramovici, Miron ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADDERS; CELLULAR ARRAYS; COMPUTER ARCHITECTURE; LOGIC GATES; PROGRAMMABLE LOGIC CONTROLLERS; RANDOM ACCESS STORAGE;

BUILT IN SELF TEST (BIST); FIELD PROGRAMMABLE GATE ARRAYS (FPGA); ITERATIVE LOGIC ARRAY; PROGRAMMABLE LOGIC BLOCKS (PLB);

INTEGRATED CIRCUIT TESTING;

EID: 0030389599     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)