Approach for testing programmable/configurable field programmable gate arrays

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 450-455

  Huang, W K ^a   Lombardi, F ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CONTROLLABILITY; ERROR DETECTION; FAILURE ANALYSIS; FLIP FLOP CIRCUITS; MODELS; MULTIPLEXING EQUIPMENT; OBSERVABILITY;

CONFIGURABLE FIELD PROGRAMMABLE GATE ARRAYS; HYBRID FAULT MODEL; MULTIPLEXER; PROGRAMMABLE FIELD PROGRAMMABLE GATE ARRAYS; SINGLE FAULT DETECTION;

LOGIC GATES;

EID: 0029700925     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)