SRAM-based FPGAs: Testing the embedded RAM modules

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 14, Issue 1, 1999, Pages 159-167

  Renovell, Michel ^a   Portal, Jean Michel ^a   Figueras, Joan ^b   Zorian, Yervant ^c  

^a LIRMM   (France)

^b UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

^c LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; INTEGRATED CIRCUIT TESTING; ITERATIVE METHODS; RANDOM ACCESS STORAGE; SHIFT REGISTERS;

AUTOMATED TEST PATTERN GENERATORS (ATPG); STATIC RANDOM ACCESS MEMORY (SRAM);

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 0032684283     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1008326111919     Document Type: Article

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