메뉴 건너뛰기




Volumn 34, Issue 1, 2016, Pages

Low-temperature atomic layer deposition of copper(II) oxide thin films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC LAYER DEPOSITION; COPPER OXIDES; FIELD EMISSION MICROSCOPES; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; THIN FILMS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84944339706     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.4933089     Document Type: Article
Times cited : (20)

References (46)
  • 9
    • 84908108409 scopus 로고    scopus 로고
    • C. Wang et al., Nano Energy 9, 334 (2014). 10.1016/j.nanoen.2014.08.009
    • (2014) Nano Energy , vol.9 , pp. 334
    • Wang, C.1
  • 42
    • 0020940620 scopus 로고
    • R. Swanepoel, J. Phys. E 16, 1214 (1983). 10.1088/0022-3735/16/12/023
    • (1983) J. Phys. e , vol.16 , pp. 1214
    • Swanepoel, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.