A simple spectrophotometric method for determination of the optical constants and band gap energy of multiple layer TiO2 thin films

Materials Chemistry and Physics

Volumn 83, Issue 1, 2004, Pages 169-177

  Sreemany, Monjoy ^a   Sen, Suchitra ^a  

^a CSIR CENTRAL GLASS AND CERAMIC RESEARCH INSTITUTE   (India)

Author keywords

Microstructure; Optical properties; Sol gel growth; Thin films

Indexed keywords

COATING TECHNIQUES; GLASS; MICROSTRUCTURE; MULTILAYERS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SOL-GELS; THIN FILMS; TRANSPARENCY; ULTRAVIOLET SPECTROPHOTOMETERS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

BAND GAP ENERGY;

TITANIUM DIOXIDE;

EID: 0344513940     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2003.09.030     Document Type: Article

References (32)

1. Chrysicopoulou P., Davazoglou D., Trapalis Chr., Kordas G. Thin Solid Films. 323:1998;188.
2. Yu J., Zhao X., Zhao Q. Mater. Chem. Phys. 69:2001;25.
3. Zakrzewska K., Radeska M., Rekas M. Thin Solid Films. 310:1997;161.
4. Banfi G., Degiorgo V., Ricard D. Adv. Phys. 47:1998;447.
5. Yan Y., Chaudhuri S.R., Sarkar A. J. Am. Ceram. Soc. 79:1996;1061.
6. Borgogno J.P., Lazarides B., Pelletier E. Appl. Opt. 21:1982;4020.
7. Amdt D.P., Azzam R.M.A., Bennett J.M., Borgogno J.P., Carniglia C.K., Case W.E., Dobrowolski J.A., Gibson U.J., Tuttle-Hart T., Ho F.C., Hodgkin V.A., Klapp W.P., Macleod H.A., Pelletier E., Purvis M.K., Quinn D.M., Strome D.H., Swenson R., Temple P.A., Thonn T.F. Appl. Opt. 23:1984;3571.
8. Bennett J.M., Pelletier E., Albrand G., Borgogno J.P., Lazarides B., Carniglia C.K., Schmell R.A., Allen T.H., Tuttle-Hart T., Guenther K.H., Saxer A. Appl. Opt. 28:1989;3303.
9. Ylilammi M., Ranta-Aho T. Thin Solid Films. 232:1993;56.
10. Dobrowolski J.A., Ho F.C., Waldrof A. Appl. Opt. 22:1983;3191.
11. D. Briggs, J.C. Rivìre, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Wiley, London, 1983, p. 87.
12. Ghosh T.B., Sreemany M. Appl. Surf. Sci. 64:1993;59.
13. D. Briggs, M.P. Seah, Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Wiley, London, 1983, p. 511.
14. O.S. Heavens, Optical Properties of Thin Solid Films, Butterworths, London, 1955, p. 46.
15. H.K. Pulker, Thin films science and technology, in: Coatings on Glass, vol. 6, Elsevier, New York, 1984, p. 391.
16. H. Schroeder, Physics of thin films, in: G. Hass, R.E. Thun (Eds.), Advances in Research and Development, vol. 5, Academic Press, New York, 1969, p. 87.
17. O. Anderson, K. Bange, C. Ottermann, in: H. Bach, D. Krause (Eds.), Thin Films on Glass, Springer-Verlag, Berlin, 1997, p. 137.
18. Mosaddeq-ur-Rahman Md., Miki T., Krishna K.M., Soga T., Igarashi K., Tanemura S., Umeno M. Mater. Sci. Eng. B. 41:1996;67.
19. Nishide T., Sato M., Hara H. J. Mater. Sci. 35:2000;465.
20. Kim D.J., Hahn S.H., Oh S.H., Kim E.J. Mater. Lett. 57:2002;355.
21. B.D. Cullity, Elements of X-ray Diffraction, Addison-Wesley, Notre Dame, 1978.
22. Yu J., Zhao X., Du J., Chen W. J. Sol-Gel Sci. Technol. 17:2000;163.
23. Trapalis Ch., Kozhukharov V., Samuneva B. J. Mater. Sci. 28:1993;1276.
24. Kumar P.M., Badrinarayanan S., Sastry M. Thin Solid Films. 358:2000;122.
25. P. Swift, D. Shuttleworth, M.P. Shea, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Wiley, London, 1983, p. 437.
26. C.D. Wagner, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Wiley, London, 1983, p. 477.
27. Hu L., Yoko T., Kozuka H., Sakka S. Thin Solid Films. 219:1992;18.
28. Yoldas B.E., O'Keeffe T.W. Appl. Opt. 18:1979;3133.
29. Zhao X.K., Fendler J.H. J. Phys. Chem. 95:1991;3716.
30. Lucy I.B., Beynon J., Waters D.N. J. Mater. Sci. Lett. 14:1995;515.
31. Meng L.J., Dos Santos M.P. Thin Solid Films. 226:1993;22.
32. Aarik J., Aidla A., Kiisller A.A., Uustare T., Sammelselg V. Thin Solid Films. 305:1997;270.