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Volumn 9, Issue 3, 2003, Pages 149-156
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A study on the metal-organic CVD of pure copper films from low cost copper(II) dialkylamino-2-propoxides: Tuning the thermal properties of the precursor by small variations of the ligand
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Author keywords
Amino alkoxides; Copper; MOCVD; Thermal analysis; Thin films
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Indexed keywords
CRYSTAL ORIENTATION;
DEPOSITION;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MICROELECTRONIC PROCESSING;
PYROLYSIS;
THERMOANALYSIS;
THERMODYNAMIC PROPERTIES;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
AMINO ALKOXIDES;
LIGANDS;
MICROELECTRONIC INDUSTRY;
STRESS MIGRATION;
COPPER COMPOUNDS;
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EID: 4544373668
PISSN: 09481907
EISSN: None
Source Type: Journal
DOI: 10.1002/cvde.200306236 Document Type: Article |
Times cited : (59)
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References (19)
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