Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons

Ultramicroscopy

Volumn 159, Issue , 2015, Pages 124-137

  Close, R ^a   Chen, Z ^a   Shibata, N ^b   Findlay, S D ^a  

^a MONASH UNIVERSITY   (Australia)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

Differential phase contrast (DPC) imaging; Scanning transmission electron microscopy (STEM)

Indexed keywords

ATOMS; ELECTRON SCATTERING; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PROBES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION; ATOMIC-RESOLUTION IMAGING; DETECTOR GEOMETRY; DIFFERENTIAL PHASE CONTRAST; DIFFERENTIAL PHASE CONTRAST IMAGING; ELECTROSTATIC POTENTIALS; PROOF OF PRINCIPLES; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

ALUMINUM; LITHIUM; STRONTIUM; TITANIUM DIOXIDE;

ABSORPTION; ARTICLE; CONTROLLED STUDY; DIFFRACTION; ELASTICITY; IMAGE PROCESSING; IMAGE RECONSTRUCTION; MEASUREMENT ACCURACY; MEASUREMENT PRECISION; OPTICAL RESOLUTION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL NOISE RATIO; STATIC ELECTRICITY; SYSTEMATIC ERROR;

EID: 84941985509     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2015.09.002     Document Type: Article

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