-
1
-
-
0032560108
-
Electron microscopy image enhanced
-
Haider M, Uhlemann S, Schwan E, Rose H, Kabius B, Urban K (1998) Electron microscopy image enhanced. Nature 392: 768–769.
-
(1998)
Nature
, vol.392
, pp. 768-769
-
-
Haider, M.1
Uhlemann, S.2
Schwan, E.3
Rose, H.4
Kabius, B.5
Urban, K.6
-
2
-
-
0037043685
-
Sub-ångstrom resolution using aberration corrected electron optics
-
Batson P E, Dellby N, Krivanek O L (2002) Sub-ångstrom resolution using aberration corrected electron optics. Nature 418: 617–620.
-
(2002)
Nature
, vol.418
, pp. 617-620
-
-
Batson, P.E.1
Dellby, N.2
Krivanek, O.L.3
-
3
-
-
78649616276
-
New area detector for atomic-resolution scanning transmission electron microscopy
-
Shibata N, Kohno Y, Findlay S D, Sawada H, Kondo Y, Ikuhara Y (2010) New area detector for atomic-resolution scanning transmission electron microscopy. J. ElectronMicrosc. 59: 473–479.
-
(2010)
J. Electronmicrosc
, vol.59
, pp. 473-479
-
-
Shibata, N.1
Kohno, Y.2
Findlay, S.D.3
Sawada, H.4
Kondo, Y.5
Ikuhara, Y.6
-
4
-
-
70449719176
-
Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
-
Findlay S D, Shibata N, Sawada H, Okunishi E, Kondo Y, Yamamoto T, Ikuhara Y (2009) Robust atomic resolution imaging of light elements using scanning transmission electron microscopy. Appl. Phys. Lett. 95: 191913.
-
(2009)
Appl. Phys. Lett
, vol.95
-
-
Findlay, S.D.1
Shibata, N.2
Sawada, H.3
Okunishi, E.4
Kondo, Y.5
Yamamoto, T.6
Ikuhara, Y.7
-
5
-
-
84871759323
-
Reversible contrast in focus series of annular bright field images of a crystalline LiMn2O4 nanowire
-
Lee S, Oshima Y, Hosono E, Zhou H, Takayanagi K (2013) Reversible contrast in focus series of annular bright field images of a crystalline LiMn2O4 nanowire. Ultramicroscopy 125: 43–48.
-
(2013)
Ultramicroscopy
, vol.125
, pp. 43-48
-
-
Lee, S.1
Oshima, Y.2
Hosono, E.3
Zhou, H.4
Takayanagi, K.5
-
6
-
-
84881534350
-
On the visibility of very thin specimens in annular bright field scanning transmission electron microscopy
-
Phillips P J, Klie R F (2013) On the visibility of very thin specimens in annular bright field scanning transmission electron microscopy. Appl. Phys. Lett. 103: 033119.
-
(2013)
Appl. Phys. Lett
, vol.103
-
-
Phillips, P.J.1
Klie, R.F.2
-
7
-
-
4444225129
-
Meyer R R (2004) “Indirect” high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
-
Kirkland A I, Meyer R R (2004) “Indirect” high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction. Microsc. Microanal. 10: 401–413.
-
Microsc. Microanal
, vol.10
, pp. 401-413
-
-
Kirkland, A.I.1
-
8
-
-
0014538104
-
Image contrast in a transmission scanning electron microscope. Appl. Phys
-
Cowley J M (1969) Image contrast in a transmission scanning electron microscope. Appl. Phys. Lett. 15: 58.
-
(1969)
Lett
, vol.15
, pp. 58
-
-
Cowley, J.M.1
-
9
-
-
0012991497
-
Scanning transmission electron microscopy I
-
Zeiter E, Thomson M G (1970) Scanning transmission electron microscopy I. Optik 31: 258–280.
-
(1970)
Optik
, vol.31
, pp. 258-280
-
-
Zeiter, E.1
Thomson, M.G.2
-
10
-
-
0012991497
-
Scanning transmission electron microscopy II
-
Zeiter E, Thomson M G (1970) Scanning transmission electron microscopy II. Optik 31: 359–366.
-
(1970)
Optik
, vol.31
, pp. 359-366
-
-
Zeiter, E.1
Thomson, M.G.2
-
12
-
-
34548449872
-
Development of a parallel detection and processing system using a multidetector array forwave field restoration in scanning transmission electron microscopy
-
Taya M, Matsutani T, Ikuta T, Saito H, Ogai K, Harada Y, Tanaka T, Takai Y (2007) Development of a parallel detection and processing system using a multidetector array forwave field restoration in scanning transmission electron microscopy. Rev. Sci. Instrum. 78: 083705.
-
(2007)
Rev. Sci. Instrum
, vol.78
-
-
Taya, M.1
Matsutani, T.2
Ikuta, T.3
Saito, H.4
Ogai, K.5
Harada, Y.6
Tanaka, T.7
Takai, Y.8
-
13
-
-
0031774582
-
An aberration-free imaging technique based on focal depth extension
-
Ikuta T (1998) An aberration-free imaging technique based on focal depth extension. J. Electron Microsc. 47: 427–432.
-
(1998)
J. Electron Microsc
, vol.47
, pp. 427-432
-
-
Ikuta, T.1
-
14
-
-
38949153808
-
Wave field restoration using focal-depth extension techniques under dynamic hollow-cone illumination
-
Taya M, Ikuta T, Takai Y (2008) Wave field restoration using focal-depth extension techniques under dynamic hollow-cone illumination. Optik 119: 153–160.
-
(2008)
Optik
, vol.119
, pp. 153-160
-
-
Taya, M.1
Ikuta, T.2
Takai, Y.3
-
15
-
-
0027544927
-
Configured detectors for STEM imaging of thin specimens
-
Cowley J M (1993) Configured detectors for STEM imaging of thin specimens. Ultramicroscopy 49: 4–13.
-
(1993)
Ultramicroscopy
, vol.49
, pp. 4-13
-
-
Cowley, J.M.1
-
16
-
-
9944248771
-
Separation of linear and non-linear imaging components in highresolution transmission electron microscope images
-
Nomaguchi T, Kawasaki T, Kimura Y, Takai Y (2004) Separation of linear and non-linear imaging components in highresolution transmission electron microscope images. J. Electron Microsc. 53: 403–406.
-
(2004)
J. Electron Microsc
, vol.53
, pp. 403-406
-
-
Nomaguchi, T.1
Kawasaki, T.2
Kimura, Y.3
Takai, Y.4
-
17
-
-
27744546609
-
A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM
-
Yamasaki J, Kawai T, Tanaka N (2005) A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM. J. Electron Microsc. 54: 209–214.
-
(2005)
J. Electron Microsc
, vol.54
, pp. 209-214
-
-
Yamasaki, J.1
Kawai, T.2
Tanaka, N.3
-
18
-
-
49949108009
-
Evaluation of annular pupil for scanning transmission electron microscope formed by focused ion beam technique
-
Matsutani T, Taya M, Ikuta T, Fujimura T, Inui H, Tanaka T, Shimizu I, Kimura Y, Takai Y, Kawasaki T, Ichihashi M (2008) Evaluation of annular pupil for scanning transmission electron microscope formed by focused ion beam technique. Vacuum 83: 201–204.
-
(2008)
Vacuum
, vol.83
, pp. 201-204
-
-
Matsutani, T.1
Taya, M.2
Ikuta, T.3
Fujimura, T.4
Inui, H.5
Tanaka, T.6
Shimizu, I.7
Kimura, Y.8
Takai, Y.9
Kawasaki, T.10
Ichihashi, M.11
-
19
-
-
77956188473
-
Simulation of a hollow cone-shaped probe in aberration-corrected STEM for high-resolution tomography
-
Kawasaki T, Matsutani T, Ikuta T, Ichihashi M, Tanji T (2010) Simulation of a hollow cone-shaped probe in aberration-corrected STEM for high-resolution tomography. Ultramicroscopy 110: 1332–1337.
-
(2010)
Ultramicroscopy
, vol.110
, pp. 1332-1337
-
-
Kawasaki, T.1
Matsutani, T.2
Ikuta, T.3
Ichihashi, M.4
Tanji, T.5
-
20
-
-
1542518948
-
Electron microscopic observation of crystal lattices on the level with atomic dimension
-
Komoda T (1966) Electron microscopic observation of crystal lattices on the level with atomic dimension. Jap. J. Appl. Phys. 5: 603–607.
-
(1966)
Jap. J. Appl. Phys
, vol.5
, pp. 603-607
-
-
Komoda, T.1
|