Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy

Scientific Reports

Volumn 5, Issue , 2015, Pages

  Shibata, Naoya ^a,b   Findlay, Scott D ^c   Sasaki, Hirokazu ^d   Matsumoto, Takao ^a   Sawada, Hidetaka ^e   Kohno, Yuji ^e   Otomo, Shinya ^d   Minato, Ryuichiro ^d   Ikuhara, Yuichi ^a,f  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c MONASH UNIVERSITY   (Australia)

^d Furukawa Electric Ltd   (Japan)

^e JEOL LTD   (Japan)

^f JAPAN FINE CERAMICS CENTER   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84931268700     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep10040     Document Type: Article

References (19)

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