High-resolution STEM imaging with a quadrant detector-Conditions for differential phase contrast microscopy in the weak phase object approximation

Ultramicroscopy

Volumn 148, Issue , 2015, Pages 81-86

  Majert, S ^a   Kohl, H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Differential phase contrast; DPC; High resolution; STEM

Indexed keywords

DIFFERENTIAL PHASE CONTRAST; DPC; HIGH RESOLUTION; QUADRANT DETECTORS; STEM; STEM IMAGING; WEAK PHASE OBJECT;

ANALYTIC METHOD; ANALYTICAL EQUIPMENT; ARTICLE; ELECTRIC FIELD; ILLUMINATION; MAGNETIC FIELD; MATHEMATICAL ANALYSIS; OPTICAL RESOLUTION; PHASE CONTRAST MICROSCOPY; QUADRANT DETECTOR; SCANNING ELECTRON MICROSCOPE; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 84908191799     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2014.09.009     Document Type: Article

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