Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Ultramicroscopy

Volumn 151, Issue , 2015, Pages 160-167

  Pennycook, Timothy J ^a,b   Lupini, Andrew R ^c   Yang, Hao ^b   Murfitt, Matthew F ^d,e   Jones, Lewys ^b   Nellist, Peter D ^a,b  

^a DARESBURY LABORATORY   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d Nion Co Kirkland   (United States)

^e NONE   (United States)

Author keywords

ABF; Chromatic aberrations; DPC; Phase contrast; Pixelated detectors; Ptycography; STEM

Indexed keywords

DIFFRACTION; EFFICIENCY; PROBES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ABF; CHROMATIC ABERRATION; DPC; PHASE CONTRASTS; PIXELATED DETECTORS; PTYCOGRAPHY; STEM;

ABERRATIONS;

GRAPHENE;

ARTICLE; BRIGHT FIELD MICROSCOPY; CHEMICAL ANALYSIS; CHROMATIC ABERRATION; CONTROLLED STUDY; OPTICS; PHASE CONTRAST MICROSCOPE; PHASE CONTRAST MICROSCOPY; PTYCHOGRAPHY; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 84925465512     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2014.09.013     Document Type: Article

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