Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions

Ultramicroscopy

Volumn 151, Issue , 2015, Pages 232-239

  Yang, Hao ^a   Pennycook, Timothy J ^a,b   Nellist, Peter D ^a,b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

Author keywords

Contrast transfer function; Phase contrast; Pixelated detectors; Ptychography

Indexed keywords

IODINE; TRANSMISSION ELECTRON MICROSCOPY;

CONTRAST TRANSFER FUNCTION; CONTRAST-TRANSFER EFFICIENCY; DIFFERENTIAL PHASE CONTRAST; PHASE CONTRASTS; PHASE-CONTRAST IMAGING; PIXELATED DETECTORS; PTYCHOGRAPHY; SCANNING TRANSMISSION ELECTRON MICROSCOPES;

SIGNAL TO NOISE RATIO;

ANALYTICAL EQUIPMENT; ANNULAR BRIGHT FIELD; ARTICLE; CONTRAST ENHANCEMENT; CONTRAST TRANSFER FUNCTION; DIFFERENTIAL PHASE CONTRAST; IMAGE PROCESSING; IMAGE QUALITY; IMAGE RECONSTRUCTION; IMAGING; PHASE CONTRAST MICROSCOPY; PIXELATED DETECTOR; PROCESS OPTIMIZATION; SCANNING ELECTRON MICROSCOPE; SCANNING TRANSMISSION ELECTRON MICROSCOPE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL NOISE RATIO;

EID: 84924815012     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2014.10.013     Document Type: Article

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