Differential phase contrast 2.0-Opening new "fields" for an established technique

Ultramicroscopy

Volumn 117, Issue , 2012, Pages 7-14

  Lohr, Matthias ^a   Schregle, Ralph ^a   Jetter, Michael ^b   Wächter, Clemens ^b   Wunderer, Thomas ^c   Scholz, Ferdinand ^c   Zweck, Josef ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

^c UNIVERSITY OF ULM   (Germany)

Author keywords

Differential phase contrast; DPC; GaN InGaN GaN; Green laser; Inner electric fields; Piezoelectric field; Quantum confined Stark effect; Quantum well; STEM

Indexed keywords

DIFFERENTIAL PHASE CONTRAST; DPC; GAN/INGAN/GAN; GREEN LASER; PIEZO-ELECTRIC FIELDS; QUANTUM CONFINED STARK EFFECT; STEM;

ELECTRIC FIELDS; IMAGING TECHNIQUES; MAGNETIC FIELDS; PROBES; QUANTUM WELL LASERS;

SEMICONDUCTOR QUANTUM WELLS;

GALLIUM; INDIUM;

ARTICLE; ARTIFACT; CONTROLLED STUDY; CRYSTAL STRUCTURE; DIFFERENTIAL PHASE CONTRAST MICROSCOPY; ELECTRIC FIELD; ELECTRON BEAM; ELECTRON PROBE MICROANALYSIS; MAGNETIC FIELD; PHASE CONTRAST MICROSCOPY; PIEZOELECTRICITY; POLARIZATION; QUANTITATIVE ANALYSIS; QUANTUM MECHANICS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS; SIGNAL NOISE RATIO;

EID: 84861332837     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.03.020     Document Type: Article

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