Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction

Applied Physics Letters

Volumn 93, Issue 18, 2008, Pages

  Morishita, Shigeyuki ^a   Yamasaki, Jun ^a   Nakamura, Keisuke ^a   Kato, Takeharu ^b   Tanaka, Nobuo ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b JAPAN FINE CERAMICS CENTER   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; DIFFRACTION; ELECTRON BEAMS; ELECTRON GUNS; ELECTRONS; OPTICAL PROPERTIES; PARTICLE BEAMS; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SPHERES; THICK FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTIONS; CRYSTALLINE SILICONS; DIFFRACTIVE IMAGING; EMPTY SPACES; LOCALIZED STRUCTURES; PRESENT METHODS; SELECTED AREA DIFFRACTIONS; SPATIAL RESOLUTIONS; THIN FILM SAMPLES; TRANSMISSION ELECTRON MICROSCOPES;

CRYSTAL ATOMIC STRUCTURE;

EID: 55849092888     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3003582     Document Type: Article

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