Direct observation of switching processes in Permalloy rings with Lorentz microscopy

Physical Review Letters

Volumn 93, Issue 4, 2004, Pages

  Uhlig, T ^a   Zweck, J ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DYNAMIC RANDOM ACCESS STORAGE; ELECTRON BEAM LITHOGRAPHY; ELECTRON BEAMS; FIELD EMISSION MICROSCOPES; HIGH RESOLUTION ELECTRON MICROSCOPY; MAGNETIC FIELDS; MAGNETIC FLUX; MAGNETIC HYSTERESIS; OPTICAL KERR EFFECT; PHOTOEMISSION; SCANNING ELECTRON MICROSCOPY;

DIFFERENTIAL PHASE CONTRAST MICROSCOPY (DPC); LORENTZ MICROSCOPY; MAGNETIC FORCE MICROSCOPY (MFM); PERMALLOY RINGS;

SWITCHING;

EID: 4344711377     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.047203     Document Type: Article

References (13)

1. J. G. Zhu, Y. Zheng, and G. A. Prinz, J. Appl. Phys. 87, 6668 (2000).
2. S. P. Li et al., Phys. Rev. Lett. 86, 1102 (2001).
3. M. Kläui et al., Appl. Phys. Lett. 78, 3268 (2001).
4. M. Kläui et al, J. Phys. Condens. Matter 15, 985(R) (2003).
5. M. Kläui et al., Phys. Rev. B 68, 134426 (2003).
6. J.N. Chapman, J. Phys. D 17, 623 (1984).
7. J.N. Chapman and M.R. Scheinfein, J. Magn. Magn. Mater. 200, 729 (1999).
8. M. Schneider, H. Hoffmann, and J. Zweck, Appl. Phys. Lett. 77, 2909 (2000).
9. J.N. Chapman, I.R. McFadyen, and S. McVitie, IEEE Trans. Magn. 26, 1506 (1990).
10. J. Zweck, J. N. Chapman, S. McVitie, and H. Hoffmann, J. Magn. Magn. Mater. 104-107, 315 (1992).
11. J. Rothman et al., Phys. Rev. Lett. 86, 1098 (2001).
12. T. Uhlig, and J. Zweck, Ultramicroscopy 99, 137 (2004).
13. R. D. McMichael and M. J. Donahue, IEEE Trans. Magn. 33, 4167 (1997).