At Tape-out: Can System Yield in Terms of Timing/Energy Specifications Be Predicted?

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007

Volumn , Issue , 2007, Pages 773-778

  Papanikolaou, Antonis ^a   Miranda, Miguel ^a   Marchal, Pol ^a   Dierickx, Bart ^a   Catthoor, Francky ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY UTILIZATION; INTEGRATED CIRCUITS;

ACCURATE ESTIMATION; DYNAMIC ENERGY; DYNAMIC ENERGY CONSUMPTION; PROCESS VARIABILITY; REGISTER TRANSFER LEVEL; SEMICONDUCTOR PROCESS; VARIABILITY INFORMATION; VARIABILITY-AWARE;

SPECIFICATIONS;

EID: 84938578084     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2007.4405844     Document Type: Conference Paper

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