Impact of intrinsic parameter fluctuations on DECA-nanometer circuits, and circuit modelling techniques

Proceedings of the International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006

Volumn , Issue , 2006, Pages 117-121

  Cheng, B ^a   Roy, S ^a   Asenov, A ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Compact model; Intrinsic parameter fluctuations; SRAM; Statistical circuit simulation; Statistical device simulation

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; PARAMETER ESTIMATION; RANDOM PROCESSES;

COMPACT MODEL; INTRINSIC PARAMETER FLUCTUATIONS; STATISTICAL CIRCUIT SIMULATION; STATISTICAL DEVICE SIMULATION;

NETWORKS (CIRCUITS);

EID: 39549096827     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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