A system-level methodology for fully compensating process variability impact of memory organizations in periodic applications

CODES+ISSS 2005 - International Conference on Hardware/Software Codesign and System Synthesis

Volumn , Issue , 2005, Pages 117-122

  Papanikolaou, A ^a   Lobmaier, F ^a,b   Wang, H ^a,c   Miranda, M ^a,c   Catthoor, F ^a  

^a IMEC   (Belgium)

^b Technical Univ of Hagenberg   (Austria)

^c UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Parametric yield; Process variability; System level compensation

Indexed keywords

ENERGY UTILIZATION; STATISTICAL METHODS; SYSTEMS ANALYSIS;

PARAMETRIC YIELD; PROCESS VARIABILITY; STATISTICAL TIMING ANALYSIS; SYSTEM-LEVEL COMPENSATION;

STORAGE ALLOCATION (COMPUTER);

EID: 27644553810     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1084834.1084866     Document Type: Conference Paper

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