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Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy

Volumn 149, Issue , 2015, Pages 127-131

Influence of homo buffer layer thickness on the quality of ZnO epilayers

(2) Eid, E A a Fouda, A N b

a HIGHER TECHNOLOGICAL INSTITUTE (Egypt)

b Suez Canal University (Egypt)

Author keywords

AFM; Buffer layer; Raman spectroscopy; Threading dislocation; ZnO films

Indexed keywords

ATOMIC FORCE MICROSCOPY; BUFFER LAYERS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); EPILAYERS; MAGNETRON SPUTTERING; METALLIC FILMS; OPTICAL WAVEGUIDES; RAMAN SPECTROSCOPY; SAPPHIRE; X RAY DIFFRACTION; ZINC SULFIDE;

AFM; MICRO-RAMAN SCATTERING; RADIO FREQUENCY MAGNETRON SPUTTERING; RAMAN-ACTIVE PHONON; THREADING DISLOCATION; WURTZITE STRUCTURE; X-RAY DIFFRACTION MEASUREMENTS; ZNO FILMS;

ZINC OXIDE;

EID: 84929452693 PISSN: 13861425 EISSN: None Source Type: Journal
DOI: 10.1016/j.saa.2015.03.125 Document Type: Article

Times cited : (7)

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