Mechanical failure modes of chronically implanted planar silicon-based neural probes for laminar recording

Biomaterials

Volumn 37, Issue , 2015, Pages 25-39

  Kozai, Takashi D Y ^a,b,c   Catt, Kasey ^a   Li, Xia ^a   Gugel, Zhannetta V ^a,f   Olafsson, Valur T ^d   Vazquez, Alberto L ^a,e   Cui, X Tracy ^a,b,c  

^a University of Pittsburgh   (United States)

^b CENTER FOR THE NEURAL BASIS OF COGNITION   (United States)

^c MCGOWAN INSTITUTE FOR REGENERATIVE MEDICINE   (United States)

^d UNIVERSITY OF PITTSBURGH   (United States)

^e UNIVERSITY OF PITTSBURGH SCHOOL OF MEDICINE   (United States)

^f CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Abiotic Failure; Intracortical electrode; Magnetic resonance imaging; Material failure; Neural interface; Structural failure

Indexed keywords

BRAIN; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTROPHYSIOLOGY; FAILURE (MECHANICAL); FINITE ELEMENT METHOD; FRACTURE MECHANICS; INTERFACES (MATERIALS); MAGNETIC RESONANCE IMAGING; MECHANISMS; NEUROLOGY; SCANNING ELECTRON MICROSCOPY; SILICON; STRAIN; TISSUE;

CHRONIC INFLAMMATION; INTRACORTICAL ELECTRODE; MATERIAL FAILURES; MECHANICAL FAILURE MODE; NEURAL INTERFACES; PERFORMANCE DEGRADATION; REACTIVE TISSUE RESPONSE; STRUCTURAL FAILURE;

ELECTROCHEMICAL ELECTRODES;

SILICON;

ANALYTICAL PARAMETERS; ANIMAL EXPERIMENT; ANIMAL MODEL; ANIMAL TISSUE; ARTICLE; BRAIN TISSUE; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTRODE IMPLANTATION; ELECTROPHYSIOLOGICAL PROCEDURES; FEMALE; FINITE ELEMENT ANALYSIS; HUMAN; HUMAN TISSUE; IMMUNOHISTOCHEMISTRY; IMPEDANCE; MECHANICAL FAILURE MODE; MECHANICAL PROBE; MICROELECTRODE; MOUSE; NONHUMAN; NUCLEAR MAGNETIC RESONANCE IMAGING; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SIGNAL NOISE RATIO; TISSUE REACTION; YOUNG MODULUS; ANATOMY AND HISTOLOGY; ANIMAL; BRAIN; C57BL MOUSE; CEBUS; CHEMISTRY; ELECTRODE IMPLANT; MECHANICAL STRESS; PHYSIOLOGY; PROSTHESIS FAILURE;

MUS;

ANIMALS; BRAIN; CEBUS; ELECTRIC IMPEDANCE; ELECTRODES, IMPLANTED; FINITE ELEMENT ANALYSIS; HUMANS; MAGNETIC RESONANCE IMAGING; MICE, INBRED C57BL; MICROSCOPY, ELECTRON, SCANNING; MODELS, ANIMAL; PROSTHESIS FAILURE; SILICON; STRESS, MECHANICAL;

EID: 84921412508     PISSN: 01429612     EISSN: 18785905     Source Type: Journal    
DOI: 10.1016/j.biomaterials.2014.10.040     Document Type: Article

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