Failure mode analysis of silicon-based intracortical microelectrode arrays in non-human primates

Journal of Neural Engineering

Volumn 10, Issue 6, 2013, Pages

  Barrese, James C ^a,b,c   Rao, Naveen ^b   Paroo, Kaivon ^b   Triebwasser, Corey ^b   Vargas Irwin, Carlos ^b   Franquemont, Lachlan ^b   Donoghue, John P ^b,c  

^a RWJ Barnabas Health   (United States)

^b BROWN UNIVERSITY   (United States)

^c DEPARTMENT OF VETERANS AFFAIRS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRAIN COMPUTER INTERFACES (BCIS); CLASSIFICATION SYSTEM; FAILURE MODE ANALYSIS; IMPEDANCE MEASUREMENT; MEAN TIME TO FAILURE; MICROELECTRODE ARRAY; PEOPLE WITH DISABILITIES; RETROSPECTIVE ANALYSIS;

BIOLOGICAL MATERIALS; BRAIN COMPUTER INTERFACE; FAILURE MODES; HANDICAPPED PERSONS; INSULATING MATERIALS; MAMMALS; SENSORS; SILICON;

QUALITY CONTROL;

BIOMATERIAL; SILICON;

ANIMAL EXPERIMENT; ANIMAL MODEL; ANIMAL TISSUE; ARTICLE; BIOMECHANICS; BRAIN COMPUTER INTERFACE; BRAIN TISSUE; CONTROLLED STUDY; ELECTRODE IMPLANT; ELECTRONIC SENSOR; EQUIPMENT FAILURE; FEMALE; IMPEDANCE; IMPLANTATION; INTRACORTICAL MICROELECTRODE ARRAY; MALE; MENINX; MICROELECTRODE; NOISE; NOISE MEASUREMENT; NONHUMAN; PARENCHYMA; PRIORITY JOURNAL; RECORDING; RETROSPECTIVE STUDY; RHESUS MONKEY; SIGNAL DETECTION; SPIKE;

ANIMALS; CEREBRAL CORTEX; ELECTRODES, IMPLANTED; EQUIPMENT FAILURE ANALYSIS; FEMALE; MACACA MULATTA; MALE; MICROELECTRODES; SILICON;

EID: 84889010832     PISSN: 17412560     EISSN: 17412552     Source Type: Journal    
DOI: 10.1088/1741-2560/10/6/066014     Document Type: Article

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