Imaging techniques for quantitative silicon material and solar cell analysis

IEEE Journal of Photovoltaics

Volumn 4, Issue 6, 2014, Pages 1502-1510

  Michl, Bernhard ^a   Padilla, Milan ^a   Geisemeyer, Ino ^a   Haag, Stephen T ^a   Schindler, Florian ^a   Schubert, Martin C ^a   Warta, Wilhelm ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

Characterization; imaging; loss analysis; luminescence; silicon; spectrally resolved light beam induced current (SR LBIC); thermography

Indexed keywords

IMAGING TECHNIQUES; LUMINESCENCE; SILICON; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

CELL ANALYSIS; SILICON MATERIALS; SPECTRALLY RESOLVED LIGHT-BEAM-INDUCED CURRENT (SR-LBIC);

CHARACTERIZATION;

EID: 84908236096     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2014.2358795     Document Type: Article

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