Photoconductance-calibrated photoluminescence lifetime imaging of crystalline silicon

Physica Status Solidi - Rapid Research Letters

Volumn 2, Issue 6, 2008, Pages 245-247

  Herlufsen, Sandra ^a   Schmidt, Jan ^a   Hinken, David ^a   Bothe, Karsten ^a   Brendel, Rolf ^a  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE VALUES; CHARGE-COUPLED DEVICE CAMERA; CONTACT LESS; CRYSTALLINE SILICONS; DECAY MEASUREMENTS; EXCESS CARRIERS; HIGH RESOLUTION; MEASUREMENT CONDITIONS; MULTICRYSTALLINE SILICON WAFERS; PHOTOCONDUCTANCE; PHOTOLUMINESCENCE LIFETIME; PHOTOLUMINESCENCE MEASUREMENTS; PL IMAGE;

CAMERAS; PHOTOLUMINESCENCE; POLYSILICON; SEMICONDUCTING SILICON COMPOUNDS;

SILICON WAFERS;

EID: 67650782991     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200802192     Document Type: Article

References (12)

1. T. Trupke et al., Appl. Phys. Lett. 89, 044107 (2006).
2. H. Sugimoto et al., Jpn. J. Appl. Phys. 46, L339 (2007).
3. M. D. Abbott et al., J. Appl. Phys. 100, 114514 (2006).
4. D. Macdonald et al., Appl. Phys. Lett. 74, 1710 (1999).
5. J. Schmidt et al., Appl. Phys. Lett. 80, 4395 (2002).
6. M. Bail et al., Appl. Phys. Lett. 82, 757 (2003).
7. M. The et al., Proc. 22nd EUPVSEC, 354 (2007).
8. D. Macdonald et al., J. Appl. Phys. 103, 073710 (2008).
9. T. Trupke et al., in: Proceedings 18th Workshop on Cryst. Silicon Solar Cells&Modules (Vail, USA, 2008), unpublished.
10. R. Sinton and A. Cuevas, Appl. Phys. Lett. 69, 2510 (1996).
11. J. Schmidt, IEEE Trans. Electron Devices 46, 2018 (1999).
12. T. Trupke, J. Appl. Phys. 100, 063531 (2006).