Recombination current and series resistance imaging of solar cells by combined luminescence and lock-in thermography

Applied Physics Letters

Volumn 90, Issue 15, 2007, Pages

  Ramspeck, K ^a   Bothe, K ^a   Hinken, D ^a   Fischer, B ^a   Schmidt, J ^a   Brendel, R ^a  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; ELECTROLUMINESCENCE; PIXELS; THERMOGRAPHY (IMAGING);

CELL VOLTAGE; DARK LOCK IN THERMOGRAPHY (DLIT); RECOMBINATION CURRENT; SERIES RESISTANCE;

SOLAR CELLS;

EID: 34247266125     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2721138     Document Type: Article

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