Discriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 89, Issue 23, 2014, Pages

  Kuhn, Stefan ^a   Rahe, Philipp ^b  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b UNIVERSITY OF UTAH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84902578938     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.89.235417     Document Type: Article

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