Interplay of the tipsample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field

Nanotechnology

Volumn 23, Issue 4, 2012, Pages

  Such, Bartosz ^a,b   Glatzel, Thilo ^b   Kawai, Shigeki ^b   Meyer, Ernst ^b   Turansk, Robert ^c   Brndiar, Jn ^c   Tich, Ivan ^c  

^a JAGIELLONIAN UNIVERSITY   (Poland)

^b UNIVERSITY OF BASEL   (Switzerland)

^c INSTITUTE OF PHYSICS   (Slovakia)

Author keywords

[No Author keywords available]

Indexed keywords

BRIDGE SITES; BRIGHT SPOTS; COMPUTER MODELING; CU(1 1 1); FORCE FIELDS; GEOMETRICAL EFFECT; IMAGE CONTRASTS; JUNCTION STABILITY; NONCONTACT ATOMIC FORCE MICROSCOPY; TIP-SAMPLE DISTANCE;

ATOMIC FORCE MICROSCOPY;

THREE DIMENSIONAL;

EID: 84855581807     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/4/045705     Document Type: Article

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