Simulated measurement of small metal clusters by frequency-modulation non-contact atomic force microscopy

Nanotechnology

Volumn 17, Issue 7, 2006, Pages

  Fain Jr , S C ^a   Polwarth, C A ^a   Tait, S L ^a,d   Campbell, C T ^a   French, R H ^b,c  

^a UNIVERSITY OF WASHINGTON   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

^c DUPONT COMPANY   (United States)

^d MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CONTINUUM MECHANICS; FREQUENCY MODULATION; MATHEMATICAL MODELS; OSCILLATIONS; SILICATES;

ATOMIC RADII; CONTINUUM SUBSTRATE; HAMAKER CONSTANTS; NON CONTACT ATOMIC FORCE MICROSCOPY (NCAFM);

ATOMIC FORCE MICROSCOPY;

EID: 33644985255     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/7/S04     Document Type: Article

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