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Volumn 14, Issue 6, 2014, Pages 3079-3087

Imaging charge separation and carrier recombination in nanowire p-i-n junctions using ultrafast microscopy

Author keywords

charge transport; Femtosecond microscopy; silicon nanowire; ultrafast imaging

Indexed keywords

CHARGE TRANSFER; NANOWIRES; SEMICONDUCTOR JUNCTIONS; SILICON;

EID: 84902297081     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl5012118     Document Type: Article
Times cited : (53)

References (50)
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    • 83755207609 scopus 로고    scopus 로고
    • Lieber, C. M. MRS Bull. 2011, 36 (12) 1052-1063
    • (2011) MRS Bull. , vol.36 , Issue.12 , pp. 1052-1063
    • Lieber, C.M.1
  • 5
    • 0035793378 scopus 로고    scopus 로고
    • Cui, Y.; Lieber, C. M. Science 2001, 291 (5505) 851-853
    • (2001) Science , vol.291 , Issue.5505 , pp. 851-853
    • Cui, Y.1    Lieber, C.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.