Multiple oscillator models for the optical constants of polycrystalline zinc oxide thin films over a wide wavelength range

Applied Surface Science

Volumn 307, Issue , 2014, Pages 558-565

  Khoshman, J M ^a,b   Hilfiker, J N ^c   Tabet, N ^d   Kordesch, M E ^e  

^a AL HUSSEIN BIN TALAL UNIVERSITY   (Jordan)

^b IMAM ABDULRAHMAN BIN FAISAL UNIVERSITY   (Saudi Arabia)

^c J A WOOLLAM CO INC   (United States)

^d KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS   (Saudi Arabia)

^e OHIO UNIVERSITY   (United States)

Author keywords

Bandgap energy; Depolarization; Ellipsometric parameters; Gaussian oscillator; Optical constants; ZnO

Indexed keywords

CHEMICAL ANALYSIS; DEPOLARIZATION; ENERGY GAP; HETEROJUNCTIONS; II-VI SEMICONDUCTORS; MAGNETIC SEMICONDUCTORS; MAGNETRON SPUTTERING; METALLIC FILMS; OPTICAL CONSTANTS; OPTICAL FILMS; OSCILLATORS (MECHANICAL); OXIDE FILMS; REFRACTIVE INDEX; SILICON COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; TEMPERATURE; WIDE BAND GAP SEMICONDUCTORS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

BAND GAP ENERGY; DEPOLARIZATION MEASUREMENTS; ELLIPSOMETRIC PARAMETERS; GAUSSIANS; LOW TEMPERATURE PHOTOLUMINESCENCE; POLYCRYSTALLINE ZINC OXIDES; RF-MAGNETRON SPUTTERING; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

THIN FILMS;

EID: 84901379946     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2014.04.073     Document Type: Article

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