Spectroscopic ellipsometry of epitaxial ZnO layer on sapphire substrate

Journal of Applied Physics

Volumn 87, Issue 11, 2000, Pages 7820-7824

  Postava, K ^a   Sueki, H ^a   Aoyama, M ^a   Yamaguchi, T ^a   Ino, Ch ^a   Igasaki, Y ^a   Horie, M ^b  

^a SHIZUOKA UNIVERSITY   (Japan)

^b DAINIPPON SCREEN MFG CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000752509     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373461     Document Type: Article

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