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Volumn 12, Issue 6, 2012, Pages 1606-1610

Spectroscopic ellipsometry modeling of ZnO thin films with various O 2 partial pressures

Author keywords

DC sputtering; O 2 partial pressure; Spectroscopic ellipsometry; ZnO

Indexed keywords

CRYSTALLINITIES; DC MAGNETRON SPUTTERING; DC SPUTTERING; GLASS SUBSTRATES; SI (100) SUBSTRATE; SPECTRAL REGION; STRUCTURAL AND OPTICAL PROPERTIES; THERMALLY OXIDIZED; ZNO; ZNO FILMS; ZNO THIN FILM;

EID: 84863980441     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2012.05.030     Document Type: Article
Times cited : (22)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.