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Volumn 12, Issue 6, 2012, Pages 1606-1610
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Spectroscopic ellipsometry modeling of ZnO thin films with various O 2 partial pressures
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Author keywords
DC sputtering; O 2 partial pressure; Spectroscopic ellipsometry; ZnO
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Indexed keywords
CRYSTALLINITIES;
DC MAGNETRON SPUTTERING;
DC SPUTTERING;
GLASS SUBSTRATES;
SI (100) SUBSTRATE;
SPECTRAL REGION;
STRUCTURAL AND OPTICAL PROPERTIES;
THERMALLY OXIDIZED;
ZNO;
ZNO FILMS;
ZNO THIN FILM;
ATOMIC FORCE MICROSCOPY;
METALLIC FILMS;
OPTICAL FILMS;
REFRACTIVE INDEX;
SPECTROSCOPIC ELLIPSOMETRY;
SUBSTRATES;
SURFACE ROUGHNESS;
X RAY DIFFRACTION;
ZINC OXIDE;
PARTIAL PRESSURE;
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EID: 84863980441
PISSN: 15671739
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cap.2012.05.030 Document Type: Article |
Times cited : (22)
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References (21)
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