Optical and structural properties of ZnO for transparent electronics

Thin Solid Films

Volumn 516, Issue 7, 2008, Pages 1345-1349

  Logothetidis, S ^a   Laskarakis, A ^a   Kassavetis, S ^a   Lousinian, S ^a   Gravalidis, C ^a   Kiriakidis, G ^b  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^b INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

Author keywords

Flexible electronics; Spectroscopic ellipsometry; Transparent conductive oxides; Zinc oxide

Indexed keywords

ELECTRONIC EQUIPMENT; MECHANICAL STABILITY; SILICON; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

FLEXIBLE ELECTRONICS; NANOMECHANICAL TESTING; TRANSPARENT CONDUCTIVE OXIDES; TRANSPARENT ELECTRONIC DEVICES;

ZINC OXIDE;

EID: 38649086129     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.03.171     Document Type: Article

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