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Volumn 22, Issue SUPPL. 3, 2014, Pages

Reducing the efficiency droop by lateral carrier confinement in InGaN/GaN quantum-well nanorods

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DENSITY; LIGHT EMITTING DIODES; NANORODS; SEMICONDUCTOR QUANTUM WELLS;

EID: 84899813458     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.00A790     Document Type: Article
Times cited : (6)

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