Temperature-dependence of the internal efficiency droop in GaN-based diodes

Applied Physics Letters

Volumn 99, Issue 18, 2011, Pages

  Hader, J ^a,b   Moloney, J V ^a,b   Koch, S W ^c  

^a NONLINEAR CONTROL STRATEGIES INC   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

^c PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BLUE-EMITTING; EXPERIMENTAL OBSERVATION; LOSS MECHANISMS; RECOMBINATION TIME; TEMPERATURE DEPENDENCE;

DEFECT DENSITY; GALLIUM NITRIDE;

TEMPERATURE DISTRIBUTION;

EID: 80855141642     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3658031     Document Type: Article

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