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Physical Review B - Condensed Matter and Materials Physics

Volumn 84, Issue 3, 2011, Pages

Time-of-flight measurements of charge carrier diffusion in In xGa1-xN/GaN quantum wells

(4) Danhof, J a,b Schwarz, U T a,b Kaneta, A c Kawakami, Y c

a FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF (Germany)

b UNIVERSITY OF FREIBURG (Germany)

c KYOTO UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961228075 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.84.035324 Document Type: Article

Times cited : (28)

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